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Volumn 419, Issue 2-3, 1999, Pages 128-133
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Statistical analysis of step meandering on Si(113) miscut along a low symmetry azimuth
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Author keywords
Equilibrium thermodynamics and statistical mechanics; Scanning tunneling microscopy; Silicon; Surface roughening; Surface structure, morphology, roughness, and topography; Vicinal single crystal surfaces
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Indexed keywords
MATHEMATICAL MODELS;
MORPHOLOGY;
SCANNING TUNNELING MICROSCOPY;
SINGLE CRYSTALS;
STATISTICAL MECHANICS;
SURFACE ROUGHNESS;
SURFACE STRUCTURE;
SURFACE TOPOGRAPHY;
THERMODYNAMIC PROPERTIES;
DISTRIBUTION OF KINK LENGTH;
KINK EXCITATION ENERGY;
KINK-KINK SEPARATION DISTANCE;
VICINAL SINGLE CRYSTAL SURFACE;
SEMICONDUCTING SILICON;
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EID: 0033521362
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(98)00770-5 Document Type: Article |
Times cited : (2)
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References (15)
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