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Volumn 57, Issue 8, 1998, Pages R4233-R4236
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Thermal evolution of step stiffness on the Si(001) surface: Temperature-rescaled Ising-model approach
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001354019
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.57.R4233 Document Type: Article |
Times cited : (30)
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References (35)
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