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Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 148, Issue 1-4, 1999, Pages 98-103

Early stages of IBAD-film growth: Differences between (100) and polycrystalline Mo substrates

(3) Van Der Linden, Jacqueline C a Seijbel, Léon J a Thijsse, Barend J a

a DELFT UNIVERSITY OF TECHNOLOGY (Netherlands)

Author keywords

Defects; Film growth; IBAD; Molybdenum; Thermal desorption spectrometry

Indexed keywords

ARGON; CRYSTAL ORIENTATION; DEPOSITION; HELIUM; ION BEAMS; ION BOMBARDMENT; METALLIC FILMS; MOLYBDENUM; POINT DEFECTS; POLYCRYSTALLINE MATERIALS; RADIATION DAMAGE; ULTRATHIN FILMS;

ION BEAM ASSISTED DEPOSITION (IBAD); THERMAL DESORPTION SPECTROSCOPY;

FILM GROWTH;

EID: 0033513798 PISSN: 0168583X EISSN: None Source Type: Journal
DOI: 10.1016/S0168-583X(98)00878-7 Document Type: Article

Times cited : (4)

References (9)

1
- 84975016505
- F.A. Smidt, Int. Mat. Rev. 35 (1990) 61.
- (1990) Int. Mat. Rev. , vol.35 , pp. 61
- Smidt, F.A.¹

2
- 9344243242
- in print
- T.P.C. Klaver, B.J. Thijsse, Mat. Res. Soc. Symp. Proc. 504 (1998) in print.; T.P.C. Klaver, E.F.C. Haddeman, B.J. Thijsse, paper presented at the Fourth International Conference on Computer Simulation of Radiation Effects in Solids, Okayama, 1998, preprint.
- (1998) Mat. Res. Soc. Symp. Proc. , vol.504
- Klaver, T.P.C.¹ Thijsse, B.J.²

3
- 9344263707
- paper presented Okayama, preprint
- T.P.C. Klaver, B.J. Thijsse, Mat. Res. Soc. Symp. Proc. 504 (1998) in print.; T.P.C. Klaver, E.F.C. Haddeman, B.J. Thijsse, paper presented at the Fourth International Conference on Computer Simulation of Radiation Effects in Solids, Okayama, 1998, preprint.
- (1998) Fourth International Conference on Computer Simulation of Radiation Effects in Solids
- Klaver, T.P.C.¹ Haddeman, E.F.C.² Thijsse, B.J.³

4
- 0029705610
- J. van der Kuur, E.J.E. Melker, T.P. Huijgen, W.H.B. Hoondert, G.T.W.M. Bekking, A. van den Beukel, B.J. Thijsse, Mat. Res. Soc. Symp. Proc. 396 (1996) 587.
- (1996) Mat. Res. Soc. Symp. Proc. , vol.396 , pp. 587
- Van Der Kuur, J.¹ Melker, E.J.E.² Huijgen, T.P.³ Hoondert, W.H.B.⁴ Bekking, G.T.W.M.⁵ Van Den Beukel, A.⁶ Thijsse, B.J.⁷

5
- 0019533510
- A.A. van Gorkum, E.V. Kornelsen, Vacuum 31 (1981) 89.
- (1981) Vacuum , vol.31 , pp. 89
- Van Gorkum, A.A.¹ Kornelsen, E.V.²

6
- 0007489081
- A. van Veen, A. Warnaar, L.M. Caspers, Vacuum 30 (1980) 109.
- (1980) Vacuum , vol.30 , pp. 109
- Van Veen, A.¹ Warnaar, A.² Caspers, L.M.³

7
- 0009389457
- A. van Veen, W.T.M. Buters, G.J. van der Kolk, L.M. Caspers, T.R Armstrong, Nucl. Instr. and Meth. 194 (1982) 485.
- (1982) Nucl. Instr. and Meth. , vol.194 , pp. 485
- Van Veen, A.¹ Buters, W.T.M.² Van Der Kolk, G.J.³ Caspers, L.M.⁴ Armstrong, T.R.⁵

8
- 9344262604
- in press
- J. van der Kuur, B. Korevaar, M. Pols, J.C. van der Linden, B.J. Thijsse, Mat. Res. Soc. Symp. Proc. 504 (1998), in press.
- (1998) Mat. Res. Soc. Symp. Proc. , vol.504
- Van Der Kuur, J.¹ Korevaar, B.² Pols, M.³ Van Der Linden, J.C.⁴ Thijsse, B.J.⁵

9
- 0345703772
- Ph.D. Thesis, Delft University of Technology
- J. van der Kuur, Defects in thin films deposited with and without ion assistance, 1998, Ph.D. Thesis, Delft University of Technology.
- (1998) Defects in Thin Films Deposited with and Without Ion Assistance
- Van Der Kuur, J.¹

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