Critical values for multiple testing and comparisons: One step and step down procedures

Journal of Statistical Planning and Inference

Volumn 82, Issue 1-2, 1999, Pages 129-138

  Somerville, Paul N ^a  

^a UNIVERSITY OF CENTRAL FLORIDA   (United States)

Author keywords

Correlated data; Critical values; Fortran programs; Multiple comparisons; Multiple testing

Indexed keywords

EID: 0033450811     PISSN: 03783758     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0378-3758(99)00036-1     Document Type: Article

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