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Volumn 17, Issue 6, 1999, Pages 3312-3316

Fine control of deposition film compositions using radio-frequency reactive sputtering with periodic gas additions

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[No Author keywords available]

Indexed keywords


EID: 0033432505     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.582058     Document Type: Article
Times cited : (3)

References (16)
  • 3
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    • A. J. Aronson, D. Chen, and W. H. Class, Thin Solid Films 72, 535 (1980); Z. Pang, M. Boumerzoug, R. V. Kruzelecky, P. Mascher, J. G. Simmons, and D. A. Thompson, J. Vac. Sci. Technol. A 12, 83 (1994); S. Inoue, H. Uchida, K. Takeshita, K. Koterazawa, and R. P. Howson, Thin Solid Films 261, 115 (1995).
    • (1980) Thin Solid Films , vol.72 , pp. 535
    • Aronson, A.J.1    Chen, D.2    Class, W.H.3
  • 5
    • 0029324979 scopus 로고
    • A. J. Aronson, D. Chen, and W. H. Class, Thin Solid Films 72, 535 (1980); Z. Pang, M. Boumerzoug, R. V. Kruzelecky, P. Mascher, J. G. Simmons, and D. A. Thompson, J. Vac. Sci. Technol. A 12, 83 (1994); S. Inoue, H. Uchida, K. Takeshita, K. Koterazawa, and R. P. Howson, Thin Solid Films 261, 115 (1995).
    • (1995) Thin Solid Films , vol.261 , pp. 115
    • Inoue, S.1    Uchida, H.2    Takeshita, K.3    Koterazawa, K.4    Howson, R.P.5
  • 8
    • 0025416953 scopus 로고
    • A. G. Spencer and R. P. Howson, Thin Solid Films 186, 129 (1990); A. Mumtaz and W. H. Class, J. Vac. Sci. Technol. 20, 345 (1982); S. Schiller, G. Beisler, and W. Sieber, Thin Solid Films 111, 259 (1984); J. Affinito, N. Fortier, and R. R. Parsons, J. Vac. Sci. Technol. A 2, 316 (1984); A. F. Hmiel, ibid. 3, 592 (1985).
    • (1990) Thin Solid Films , vol.186 , pp. 129
    • Spencer, A.G.1    Howson, R.P.2
  • 9
    • 0019536911 scopus 로고
    • A. G. Spencer and R. P. Howson, Thin Solid Films 186, 129 (1990); A. Mumtaz and W. H. Class, J. Vac. Sci. Technol. 20, 345 (1982); S. Schiller, G. Beisler, and W. Sieber, Thin Solid Films 111, 259 (1984); J. Affinito, N. Fortier, and R. R. Parsons, J. Vac. Sci. Technol. A 2, 316 (1984); A. F. Hmiel, ibid. 3, 592 (1985).
    • (1982) J. Vac. Sci. Technol. , vol.20 , pp. 345
    • Mumtaz, A.1    Class, W.H.2
  • 10
    • 0021192551 scopus 로고
    • A. G. Spencer and R. P. Howson, Thin Solid Films 186, 129 (1990); A. Mumtaz and W. H. Class, J. Vac. Sci. Technol. 20, 345 (1982); S. Schiller, G. Beisler, and W. Sieber, Thin Solid Films 111, 259 (1984); J. Affinito, N. Fortier, and R. R. Parsons, J. Vac. Sci. Technol. A 2, 316 (1984); A. F. Hmiel, ibid. 3, 592 (1985).
    • (1984) Thin Solid Films , vol.111 , pp. 259
    • Schiller, S.1    Beisler, G.2    Sieber, W.3
  • 11
    • 84918112806 scopus 로고
    • A. G. Spencer and R. P. Howson, Thin Solid Films 186, 129 (1990); A. Mumtaz and W. H. Class, J. Vac. Sci. Technol. 20, 345 (1982); S. Schiller, G. Beisler, and W. Sieber, Thin Solid Films 111, 259 (1984); J. Affinito, N. Fortier, and R. R. Parsons, J. Vac. Sci. Technol. A 2, 316 (1984); A. F. Hmiel, ibid. 3, 592 (1985).
    • (1984) J. Vac. Sci. Technol. A , vol.2 , pp. 316
    • Affinito, J.1    Fortier, N.2    Parsons, R.R.3
  • 12
    • 68949112604 scopus 로고
    • A. G. Spencer and R. P. Howson, Thin Solid Films 186, 129 (1990); A. Mumtaz and W. H. Class, J. Vac. Sci. Technol. 20, 345 (1982); S. Schiller, G. Beisler, and W. Sieber, Thin Solid Films 111, 259 (1984); J. Affinito, N. Fortier, and R. R. Parsons, J. Vac. Sci. Technol. A 2, 316 (1984); A. F. Hmiel, ibid. 3, 592 (1985).
    • (1985) J. Vac. Sci. Technol. A , vol.3 , pp. 592
    • Hmiel, A.F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.