A (NH4)2Sx-treated InSb(001) surface studied by using x-ray photoelectron spectroscopy, low-energy electron diffraction, and inverse photoemission spectroscopy

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 17, Issue 2, 1999, Pages 421-424

  Ichikawa, S ^a,b   Suzuki, Y ^b   Sanada, N ^b   Utsumi, N ^b   Yamaguchi, T ^b   Gong, X Y ^b   Fukuda, Y ^b  

^a KOKAN KEISOKU Corp   (Japan)

^b SHIZUOKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0033413078     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.581602     Document Type: Article

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