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Volumn 37, Issue 2, 1999, Pages 119-121

Microhardness of Sb-, Sn-and Se-doped Bi2Te3 single crystals

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0033411452     PISSN: 00195596     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (6)

References (24)
  • 24
    • 0003657973 scopus 로고
    • (Butterworths Scientific Publications, London), Ch 4
    • Meyer L, in Micro-indentation hardness testing (Butterworths Scientific Publications, London), 1956, Ch 4.
    • (1956) Micro-indentation Hardness Testing
    • Meyer, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.