Hard x-ray microbeam production with synchrotron radiation: Application to microanalysis

X-Ray Spectrometry

Volumn 28, Issue 5, 1999, Pages 348-351

  Chevallier, P ^a,b   Populus, P ^a,b   Firsov, A ^c  

^a CEA SACLAY   (France)

^b UNIVERSITÉ PARIS SACLAY   (France)

^c INSTITUTE OF MICROELECTRONICS TECHNOLOGY AND HIGH PURITY MATERIALS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

SYNCHROTRONS; TRACE ELEMENTS; X RAY ABSORPTION;

ELEMENTAL MAPPING; FLUORESCENCE MICROPROBE; HARD X RAY; HARD X RAYS; HARD X-RAY BEAMS; MICROMETER SIZES; TRACES ELEMENTS; X RAY FLUORESCENCE; X-RAY MICROBEAMS; X-RAY OPTICS;

SYNCHROTRON RADIATION;

EID: 0033408574     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-4539(199909/10)28:5<348::AID-XRS362>3.0.CO;2-W     Document Type: Article

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