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Volumn 146, Issue 9, 1999, Pages 3527-3535

Analysis of the thermal oxidation of tin droplets and its implications on gas sensor stability

Author keywords

[No Author keywords available]

Indexed keywords

AGGLOMERATION; FILM GROWTH; SEMICONDUCTING FILMS; SEMICONDUCTING TIN COMPOUNDS; THERMOOXIDATION;

EID: 0033365720     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1392509     Document Type: Article
Times cited : (24)

References (32)
  • 32
    • 4243293330 scopus 로고    scopus 로고
    • Private communication, Institute of Physical and Theoretical Chemistry, Center of Interface Analysis and Sensors, University of Tübingen, D-72076 Tübingen, Germany
    • N. Bârsan, Private communication, Institute of Physical and Theoretical Chemistry, Center of Interface Analysis and Sensors, University of Tübingen, D-72076 Tübingen, Germany.
    • Bârsan, N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.