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Volumn 436, Issue 1, 1999, Pages
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Effect of sputtering-induced disorder on the surface dielectric tensor of Cu(110)
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Author keywords
[No Author keywords available]
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Indexed keywords
COPPER;
ELECTRONIC STRUCTURE;
ION BOMBARDMENT;
MATHEMATICAL MODELS;
MORPHOLOGY;
POINT DEFECTS;
SINGLE CRYSTALS;
SPECTROSCOPY;
SURFACE ROUGHNESS;
SURFACE TOPOGRAPHY;
DIPOLE-DIPOLE INTERACTIONS;
LOW INDEX SINGLE CRYSTAL SURFACES;
REFLECTION SPECTROSCOPY;
SPUTTERING INDUCED DISORDER;
SURFACE DIELECTRIC TENSOR;
SURFACE ELECTRONIC PHENOMENA;
VACANCY CONCENTRATION;
SPUTTERING;
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EID: 0033365459
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(99)00705-0 Document Type: Article |
Times cited : (31)
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References (19)
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