Magnetization reversal of a thin polycrystalline cobalt film measured by the Magneto-Optic Kerr Effect (MOKE) technique and field-dependent magnetic force microscopy

Journal of Magnetism and Magnetic Materials

Volumn 204, Issue 1, 1999, Pages 79-89

  Wedding, J B ^a   Li, M ^a   Wang, G C ^a  

^a Rensselaer Polytechnic Institute   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT; FERROMAGNETIC MATERIALS; KERR MAGNETOOPTICAL EFFECT; MAGNETIC ANISOTROPY; MAGNETIC HYSTERESIS; MAGNETIC VARIABLES MEASUREMENT; MAGNETIZATION; MICROSCOPIC EXAMINATION; POLYCRYSTALLINE MATERIALS;

MAGNETIC FORCE MICROSCOPY; MAGNETIZATION REVERSAL; THIN POLYCRYSTALLINE COBALT FILM;

MAGNETIC THIN FILMS;

EID: 0033365442     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(99)00433-3     Document Type: Article

References (38)

1. Martin Y., Wickramasinghe H.K. Appl. Phys. Lett. 50:1987;1455.
2. Grütter P., Mamin H.J., Rugar D. Wiesendanger R., Güntherodt H.-J. Scanning Tunneling Microscopy II. 1992;151-207 Springer, Berlin.
3. Gomez R.D., Burke E.R., Mayergoyz I.D. J. Appl. Phys. 79:1996;6441.
4. Phillips G.N., O'Grady K., Meng Q., Lodder J.C. IEEE Trans. Magn. 32:1996;4070.
5. Babcock K.L., Folks L., Street R., Woodward R.C., Bradbury D.L. J. Appl. Phys. 81:1997;4438.
6. Lin X., Zhu J.G., Wang G. IEEE Trans. Magn. 33:1997;3987.
7. Löhndorf M., Wadas A., Wiesendanger R. Appl. Phys. A. 65:1997;511.
8. Gibson G.A., Smyth J.F., Schultz S., Kern D.P. IEEE Trans. Magn. 27:1991;5187.
9. Gibson G.A., Schultz S. J. Appl. Phys. 73:1993;4516.
10. Chang T., Zhu J.-G., Judy J.A. J. Appl. Phys. 73:1993;6716.
11. Luo Y., Zhu J.-G. IEEE Trans. Magn. 30:1994;4080.
12. Gomez R.D., Shih M.C., New R.M.H., Pease R.F.W., White R.L. J. Appl. Phys. 80:1996;342.
13. New R.M.H., Pease R.F.W., White R.L., Osgood R.M., Babcock K. J. Appl. Phys. 79:1996;5851.
14. Gomez R.D., Mayergoyz I.D., Burke E.R. IEEE Trans. Magn. 31:1995;3346.
15. Proksch R., Runge E., Hansma P.K., Foss S., Walsh B. J. Appl. Phys. 78:1995;3303.
16. Tian F., Wang C., Shang G.Y., Wang N.X., Bai C.L. J. Vac. Sci. Technol. B 15:1997;1343.
17. Foss S., Proksch R., Moloni K., Dahlberg E.D., Cheng Y. J. Appl. Phys. 79:1996;6447.
18. Rugar D., Mamin H.J., Guethner P., Lambert S.E., Stern J.E., McFayden I., Yogi T. J. Appl. Phys. 68:1990;1169.
19. Proksch R., Skidmore G.D., Dan Dahlberg E., Foss S., Schmidt J.J., Merton C., Walsh B., Dugas M. Appl. Phys. Lett. 69:1996;2599.
20. ® Plain A-1450, Erie Scientific, 20 Post Road, Portsmouth, NH 03801, USA.
21. ® CP, ThermoMicroscopes, 1171 Borregas Avenue, Sunnyvale, CA 94089, USA.
22. C.B. Mooney, ThermoMicroscopes, private communication.
23. F.W. Bell, Model 9200, 6120 Hanging Moss Road, Orlando, FL 32807, USA.
24. M. Li, J.-H. Gan, J.B. Wedding, G.-C. Wang, in preparation.
25. Fuchs E. Z. Angew. Phys. 14:1962;203.
26. Feldtkeller E., Fuchs E. Z. Angew. Phys. 18:1964;1.
27. Holz A., Hubert A. Z. Angew. Phys. 26:1969;145.
28. Takahashi M., Kono T. J. Phys. Soc. Japan. 15:1960;936.
29. Cohen M.S. Maissel L.I., Glang R. Handbook of Thin Film Technology. 1970;68 McGraw-Hill, New York.
30. Lin H.-N., Chiou Y.H., Chen B.-M., Shieh H.-P.D., Chang C.-R. J. Appl. Phys. 83:1998;4997.
31. Nowak J. J. Appl. Phys. 72:1992;1490.
32. Skidmore G.D., Dahlberg E.D. Appl. Phys. Lett. 71:1997;3293.
33. Chikazumi S. Physics of Magnetism. 1964;Wiley, New York.
34. Mamin H.J., Rugar D., Stern J.E., Terris B.D., Lambert S.E. Appl. Phys. Lett. 53:1988;1563.
35. Prutton M. Thin Ferromagnetic Films. 1964;Butterworth Inc, Washington, DC.
36. Rave W., Belliard L., Labrune M., Thiaville A., Miltat J. IEEE Trans. Magn. 30:1994;4473.
37. Schönenberger C., Alvarado S.F. Z. Phys. B 80:1990;373.
38. Gregor Hsiao, ThermoMicroscopes, private communication.