Simple reflectometric method for measurement of weakly absorbing films

Thin Solid Films

Volumn 355, Issue , 1999, Pages 446-450

  Surdutovich, G I ^a,b   Vitlina, R Z ^a   Baranauskas, V ^a  

^a UNIVERSITY OF CAMPINAS   (Brazil)

^b FEDERAL UNIVERSITY OF MARANHÃO   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

FILM GROWTH; FILM PREPARATION; INTERFACES (MATERIALS); LIGHT ABSORPTION; LIGHT INTERFERENCE; LIGHT POLARIZATION; LIGHT REFLECTION; OPTICAL FILMS; REFRACTIVE INDEX; SUBSTRATES;

BREWSTER ANGLE; REFLECTOMETRIC METHODS; WEAKLY ABSORBING FILMS;

THIN FILMS;

EID: 0033364695     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00459-9     Document Type: Article

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