Optical properties of a slightly absorbing film for oblique incidence

Applied Optics

Volumn 38, Issue 1, 1999, Pages 205-207

  Zhang, Zhuomin M ^a  

^a UNIVERSITY OF FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001023663     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.38.000205     Document Type: Article

References (15)

1. O. S. Heavens, Optical Properties ofThin Solid Films (Dover, New York, 1965), Chap. 4, pp. 46-95.
2. M. Born and E. Wolf, Principles of Optics, 5th ed. (Pergamon, Oxford, UK, 1975), Chap. 13, pp. 611-664.
3. Z. Knittl, Optics ofThin Films (Wiley, New York, 1976), p. 195.
4. M. Q. Brewster, Thermal Radiative Transfer and Properties (Wiley, New York, 1992), Chap. 4, pp. 114-156.
5. P. Yeh, Optical Waves in Layered Media (Wiley, New York, 1988), Chap. 4, pp. 83-101.
6. C. F. Bohren and D. R. Huffman, Absorption and Scattering of Light by Small Particles (Wiley, New York, 1983), Chap. 2, pp. 12-56.
7. R. Siegel and J. R. Howell, Thermal Radiation Heat Transfer, 3rd ed. (Hemisphere, Washington, D.C., 1992), Chap. 18, pp. 923-967.
8. M. F. Modest, Radiative Heat Transfer (McGraw-Hill, New York, 1993), Chap. 2, pp. 37-74.
9. Y. P. Zhang, C. Zhou, X. S. Ge, and X. G. Liang, “A precise and simple method, the relative transmittance fringes depth method, of determining the optical constants and thickness and thin semitransparent films,” J. Phys. D. 25, 1004-1009 (1992).
10. E. D. Palik, ed., Handbook of Optical Constants of Solids (Ac-ademic, Orlando, FL, 1985 and 1991), Vols. 1 and 2.
11. Z. M. Zhang, T. R. Gentile, A. L. Migdall, and R. U. Datla, “Transmittance measurements for filters of optical density from one to ten,” Appl. Opt. 36, 8889-8895 (1997).
12. Z. M. Zhang, L. M. Hanssen, and R. U. Datla, “Polarization-dependent angular reflectance of silicon and germanium in the infrared,” Infrared Phys. Technol. 37, 539-546 (1996).
13. Z. M. Zhang, G. Lefever-Button, and F. R. Powell, “Infrared refractive index and extinction coefficient of polyimide films,” Int. J. Thermophys. 19, 905-916 (1998).
14. J.-P. Borgogno and E. Pelletier, “Determination of the extinc-tion coefficient of dielectric thin films from spectrophotometric measurements,” Appl. Opt. 28, 2895-2901 (1989).
15. M. Commandré, P. Roche, J.-P. Borgogno, and G. Albrand, “Absorption mapping for characterization of glass surfaces,” Appl. Opt. 34, 2372-2379 (1995).