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Volumn , Issue , 1999, Pages 107-112

Polynomial-time algorithm for power constrained testing of core based systems

Author keywords

[No Author keywords available]

Indexed keywords

POLYNOMIAL-TIME ALGORITHMS; SYSTEMS-ON-CHIP (SOC);

EID: 0033357319     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article
Times cited : (21)

References (11)
  • 3
    • 0031163752 scopus 로고    scopus 로고
    • Scheduling tests for VLSI systems under power constraints
    • June
    • R.M. Chou, K.K. Saluja and V.D. Agrawal. Scheduling Tests for VLSI Systems Under Power Constraints. IEEE Trans. on VLSI Systems, Vol.5, Pages 175-185,No.2, June 1997.
    • (1997) IEEE Trans. on VLSI Systems , vol.5 , Issue.2 , pp. 175-185
    • Chou, R.M.1    Saluja, K.K.2    Agrawal, V.D.3
  • 8
    • 0031248729 scopus 로고    scopus 로고
    • Core design and system-on-a- chip integration
    • October-December
    • A.M. Rincon et al. Core Design and System-on-a- Chip Integration. IEEE Design and Test of Computers, pages 26-34, October-December 1997.
    • (1997) IEEE Design and Test of Computers , pp. 26-34
    • Rincon, A.M.1
  • 9
    • 0002312807 scopus 로고
    • Built in loggic block observation technique
    • October
    • B.Konemann, J.Mucha, and G.Zwiehoff. Built in Loggic Block Observation Technique.Proc.Int.Test Conf., pages 37-41, October 1979.
    • (1979) Proc.Int.Test Conf. , pp. 37-41
    • Konemann, B.1    Mucha, J.2    Zwiehoff, G.3
  • 11
    • 0002129847 scopus 로고
    • A distributed BIST control scheme for complex VLSI devices
    • April
    • Y. Zorian.A distributed BIST control scheme for complex VLSI devices. Proceedings of 11th IEEE VLSI Test Symposium. April 1993, pages 4-9.
    • (1993) Proceedings of 11th IEEE VLSI Test Symposium , pp. 4-9
    • Zorian, Y.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.