메뉴 건너뛰기




Volumn 15, Issue 3, 1999, Pages 255-265

Decentralized BIST methodology for system level interconnects

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; VECTORS;

EID: 0033357216     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1008336824268     Document Type: Article
Times cited : (5)

References (18)
  • 4
    • 0024861465 scopus 로고
    • Design and Implementation of a Hierarchical Testable Architecture Using the Boundary Scan Standard
    • R.P. van Riessen, H.G. Kerkhoff, and A. Kloppenburg, "Design and Implementation of a Hierarchical Testable Architecture Using the Boundary Scan Standard," Proc. Int'l Test Conference, 1989, pp. 112-118.
    • (1989) Proc. Int'l Test Conference , pp. 112-118
    • Van Riessen, R.P.1    Kerkhoff, H.G.2    Kloppenburg, A.3
  • 5
    • 0027804583 scopus 로고
    • Utilizing Boundary Scan to Implement BIST
    • T. Langford, "Utilizing Boundary Scan to Implement BIST," Proc. Int'l Test Conference, 1993, pp. 167-173.
    • (1993) Proc. Int'l Test Conference , pp. 167-173
    • Langford, T.1
  • 6
    • 0024121727 scopus 로고
    • Testing and Diagnosis of Interconnects Using Boundary Scan Architecture
    • A.J. Hassan, J. Rajski, and V.K. Agarwal, "Testing and Diagnosis of Interconnects Using Boundary Scan Architecture," Proc. Int'l Test Conference, 1988, pp. 126-137.
    • (1988) Proc. Int'l Test Conference , pp. 126-137
    • Hassan, A.J.1    Rajski, J.2    Agarwal, V.K.3
  • 9
    • 84882252138 scopus 로고
    • On the Design of Self-Checking Boundary Scanable Boards
    • M. Lubaszewski and B. Courtois, "On the Design of Self-Checking Boundary Scanable Boards," Proc. Int'l Test Conference, 1992, pp. 372-381.
    • (1992) Proc. Int'l Test Conference , pp. 372-381
    • Lubaszewski, M.1    Courtois, B.2
  • 10
    • 0003384542 scopus 로고
    • An IDDQ Based Built-in Concurrent Test Technique for Interconnects in a Boundary Scan Environment
    • C. Su, K. Hwang, and S. Jou, "An IDDQ Based Built-in Concurrent Test Technique for Interconnects in a Boundary Scan Environment," Proc. Int'l Test Conference, 1994, pp. 670-676.
    • (1994) Proc. Int'l Test Conference , pp. 670-676
    • Su, C.1    Hwang, K.2    Jou, S.3
  • 12
    • 0030398939 scopus 로고    scopus 로고
    • Backplane Interconnect Test in a Boundary-Scan Environment
    • W. Ke, "Backplane Interconnect Test in a Boundary-Scan Environment," Proc. Int'l Test Conference, 1996, pp. 717-724.
    • (1996) Proc. Int'l Test Conference , pp. 717-724
    • Ke, W.1
  • 13
    • 0026676972 scopus 로고
    • Achieving Board-Level BIST Using the Bundary Scan Master
    • N. Jarwala and C.W. Yau, "Achieving Board-Level BIST Using the Bundary Scan Master," Proc. Int'l Test Conference, 1991, pp. 649-558.
    • (1991) Proc. Int'l Test Conference , pp. 649-1558
    • Jarwala, N.1    Yau, C.W.2
  • 15
    • 0000999174 scopus 로고
    • Applications of the IEEE P1149.5 Module Test and Maintenance Bus
    • D. Landis, C. Hudson, and P. McHugh, "Applications of the IEEE P1149.5 Module Test and Maintenance Bus," Proc. Int'l Test Conference, 1992, pp. 984-992.
    • (1992) Proc. Int'l Test Conference , pp. 984-992
    • Landis, D.1    Hudson, C.2    McHugh, P.3
  • 16
    • 77953901108 scopus 로고
    • A Proposed Methods of Accessing 1149.1 in a Backplane Environment
    • L. Whetsel, "A Proposed Methods of Accessing 1149.1 in a Backplane Environment," Proc. Int'l Test Conference, 1992, pp. 206-216.
    • (1992) Proc. Int'l Test Conference , pp. 206-216
    • Whetsel, L.1
  • 17
    • 0027796532 scopus 로고
    • Hierarchically Accessing 1149.1 Applications in a System Environment
    • L. Whetsel, "Hierarchically Accessing 1149.1 Applications in a System Environment," Proc. Int'l Test Conference, 1993, pp. 517-526.
    • (1993) Proc. Int'l Test Conference , pp. 517-526
    • Whetsel, L.1
  • 18
    • 0026618691 scopus 로고
    • An Architecture for Extending the IEEE Standard 1149.1 Test Access Port to System Backplanes
    • D. Bhavsar, "An Architecture for Extending the IEEE Standard 1149.1 Test Access Port to System Backplanes," Proc. Int'l Test Conference, 1991, pp. 768-776.
    • (1991) Proc. Int'l Test Conference , pp. 768-776
    • Bhavsar, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.