-
3
-
-
0343647681
-
Panel: P1149.4 Mixed-Signal Test Bus Framework Proposal
-
M. Soma, R. Hulse, M. Jarwala, and B. Wilkins, "Panel: P1149.4 Mixed-Signal Test Bus Framework Proposal," Proc. Int'l Test Conference, 1992, pp. 554-556.
-
(1992)
Proc. Int'l Test Conference
, pp. 554-556
-
-
Soma, M.1
Hulse, R.2
Jarwala, M.3
Wilkins, B.4
-
4
-
-
0024861465
-
Design and Implementation of a Hierarchical Testable Architecture Using the Boundary Scan Standard
-
R.P. van Riessen, H.G. Kerkhoff, and A. Kloppenburg, "Design and Implementation of a Hierarchical Testable Architecture Using the Boundary Scan Standard," Proc. Int'l Test Conference, 1989, pp. 112-118.
-
(1989)
Proc. Int'l Test Conference
, pp. 112-118
-
-
Van Riessen, R.P.1
Kerkhoff, H.G.2
Kloppenburg, A.3
-
5
-
-
0027804583
-
Utilizing Boundary Scan to Implement BIST
-
T. Langford, "Utilizing Boundary Scan to Implement BIST," Proc. Int'l Test Conference, 1993, pp. 167-173.
-
(1993)
Proc. Int'l Test Conference
, pp. 167-173
-
-
Langford, T.1
-
6
-
-
0024121727
-
Testing and Diagnosis of Interconnects Using Boundary Scan Architecture
-
A.J. Hassan, J. Rajski, and V.K. Agarwal, "Testing and Diagnosis of Interconnects Using Boundary Scan Architecture," Proc. Int'l Test Conference, 1988, pp. 126-137.
-
(1988)
Proc. Int'l Test Conference
, pp. 126-137
-
-
Hassan, A.J.1
Rajski, J.2
Agarwal, V.K.3
-
7
-
-
0025478918
-
Diagnosis for Wiring Interconnects
-
W.T. Cheng, J.L, Lewandowski, and L. Wu, "Diagnosis for Wiring Interconnects," Proc. Int'l Test Conference, 1990, pp. 565-571.
-
(1990)
Proc. Int'l Test Conference
, pp. 565-571
-
-
Cheng, W.T.1
Lewandowski, J.L.2
Wu, L.3
-
9
-
-
84882252138
-
On the Design of Self-Checking Boundary Scanable Boards
-
M. Lubaszewski and B. Courtois, "On the Design of Self-Checking Boundary Scanable Boards," Proc. Int'l Test Conference, 1992, pp. 372-381.
-
(1992)
Proc. Int'l Test Conference
, pp. 372-381
-
-
Lubaszewski, M.1
Courtois, B.2
-
10
-
-
0003384542
-
An IDDQ Based Built-in Concurrent Test Technique for Interconnects in a Boundary Scan Environment
-
C. Su, K. Hwang, and S. Jou, "An IDDQ Based Built-in Concurrent Test Technique for Interconnects in a Boundary Scan Environment," Proc. Int'l Test Conference, 1994, pp. 670-676.
-
(1994)
Proc. Int'l Test Conference
, pp. 670-676
-
-
Su, C.1
Hwang, K.2
Jou, S.3
-
11
-
-
0029736612
-
Decentralized BIST for 1149.1 and 1149.5 Based Interconnects
-
C. Su, S.J. Jou, and Y.T. Ting, "Decentralized BIST for 1149.1 and 1149.5 Based Interconnects," Proc. European Design and Test Conference, 1996, pp. 120-125.
-
(1996)
Proc. European Design and Test Conference
, pp. 120-125
-
-
Su, C.1
Jou, S.J.2
Ting, Y.T.3
-
12
-
-
0030398939
-
Backplane Interconnect Test in a Boundary-Scan Environment
-
W. Ke, "Backplane Interconnect Test in a Boundary-Scan Environment," Proc. Int'l Test Conference, 1996, pp. 717-724.
-
(1996)
Proc. Int'l Test Conference
, pp. 717-724
-
-
Ke, W.1
-
13
-
-
0026676972
-
Achieving Board-Level BIST Using the Bundary Scan Master
-
N. Jarwala and C.W. Yau, "Achieving Board-Level BIST Using the Bundary Scan Master," Proc. Int'l Test Conference, 1991, pp. 649-558.
-
(1991)
Proc. Int'l Test Conference
, pp. 649-1558
-
-
Jarwala, N.1
Yau, C.W.2
-
14
-
-
0343647667
-
A Framework for Boundary-Scan Based System Test and Diagnosis
-
N. Jarwala, C.W. Yau, P. Stiling, and E. Tammaru, "A Framework for Boundary-Scan Based System Test and Diagnosis," Proc. Int'l Test Conference, 1992, pp. 993-998.
-
(1992)
Proc. Int'l Test Conference
, pp. 993-998
-
-
Jarwala, N.1
Yau, C.W.2
Stiling, P.3
Tammaru, E.4
-
15
-
-
0000999174
-
Applications of the IEEE P1149.5 Module Test and Maintenance Bus
-
D. Landis, C. Hudson, and P. McHugh, "Applications of the IEEE P1149.5 Module Test and Maintenance Bus," Proc. Int'l Test Conference, 1992, pp. 984-992.
-
(1992)
Proc. Int'l Test Conference
, pp. 984-992
-
-
Landis, D.1
Hudson, C.2
McHugh, P.3
-
16
-
-
77953901108
-
A Proposed Methods of Accessing 1149.1 in a Backplane Environment
-
L. Whetsel, "A Proposed Methods of Accessing 1149.1 in a Backplane Environment," Proc. Int'l Test Conference, 1992, pp. 206-216.
-
(1992)
Proc. Int'l Test Conference
, pp. 206-216
-
-
Whetsel, L.1
-
17
-
-
0027796532
-
Hierarchically Accessing 1149.1 Applications in a System Environment
-
L. Whetsel, "Hierarchically Accessing 1149.1 Applications in a System Environment," Proc. Int'l Test Conference, 1993, pp. 517-526.
-
(1993)
Proc. Int'l Test Conference
, pp. 517-526
-
-
Whetsel, L.1
-
18
-
-
0026618691
-
An Architecture for Extending the IEEE Standard 1149.1 Test Access Port to System Backplanes
-
D. Bhavsar, "An Architecture for Extending the IEEE Standard 1149.1 Test Access Port to System Backplanes," Proc. Int'l Test Conference, 1991, pp. 768-776.
-
(1991)
Proc. Int'l Test Conference
, pp. 768-776
-
-
Bhavsar, D.1
|