Backplane interconnect test in a boundary-scan environment

IEEE International Test Conference (TC)

Volumn , Issue , 1996, Pages 717-724

  Ke, Wuudiann ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; INTERCONNECTION NETWORKS; PRINTED CIRCUIT BOARDS;

BACKPLANE INTERCONNECT TEST; BOUNDARY SCAN ENVIRONMENT;

PRINTED CIRCUIT TESTING;

EID: 0030398939     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)