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Volumn 22, Issue 4, 1999, Pages 274-281

Development of the wafer level compressive-flow underfill process and its involved materials

Author keywords

[No Author keywords available]

Indexed keywords

CURING; DIFFERENTIAL SCANNING CALORIMETRY; ELECTRIC CONTACTS; EPOXY RESINS; FLIP CHIP DEVICES; FLUXES; PRINTED CIRCUIT BOARDS; RHEOMETERS; SOLDERED JOINTS; THERMAL EXPANSION; THERMOGRAVIMETRIC ANALYSIS; VISCOSITY;

EID: 0033356402     PISSN: 1521334X     EISSN: None     Source Type: Journal    
DOI: 10.1109/6104.816094     Document Type: Article
Times cited : (14)

References (11)
  • 1
    • 0030204345 scopus 로고    scopus 로고
    • Trends in IC packaging
    • Aug.
    • R. Marrs, "Trends in IC packaging," Electron. Packag. Prod., pp. 24-30, Aug. 1996.
    • (1996) Electron. Packag. Prod. , pp. 24-30
    • Marrs, R.1
  • 3
    • 0002567364 scopus 로고
    • Resin-insertion effect on thermal cycle resistivity of flip-chip mounted LSI devices
    • F. Nakano, T. Soga, and S. Amagi, "Resin-insertion effect on thermal cycle resistivity of flip-chip mounted LSI devices," in Proc. Int. Soc. Hybrid Microelectron. Conf. '87, 1987, p. 536.
    • (1987) Proc. Int. Soc. Hybrid Microelectron. Conf. '87 , pp. 536
    • Nakano, F.1    Soga, T.2    Amagi, S.3
  • 5
    • 0002651995 scopus 로고
    • Underfill encapsulant for flip chip applications
    • J. H. Lau, Ed. New York: Van Nostrand Reinhold
    • D. Suryanarayana and D. S. Farquhar, "Underfill encapsulant for flip chip applications," in Chip on Board, J. H. Lau, Ed. New York: Van Nostrand Reinhold, 1994, pp. 504-531.
    • (1994) Chip on Board , pp. 504-531
    • Suryanarayana, D.1    Farquhar, D.S.2
  • 6
    • 0031369754 scopus 로고    scopus 로고
    • High performance underfills development-Materials, process, and reliability
    • L. Nguyen et al., "High performance underfills development-Materials, process, and reliability," in Proc. PEP '97, 1997, p. 300.
    • (1997) Proc. PEP '97 , pp. 300
    • Nguyen, L.1
  • 7
    • 33749926058 scopus 로고    scopus 로고
    • "No-flow underfill for flip-chip packages," U.S. Patent pending, Apr.
    • C. P. Wong and D. F. Baldwin, "No-flow underfill for flip-chip packages," U.S. Patent pending, Apr. 1996.
    • (1996)
    • Wong, C.P.1    Baldwin, D.F.2
  • 9
    • 0031625577 scopus 로고    scopus 로고
    • Study of the fluxing agent effects on the properties of no-flow underfill materials for flip-chip applications
    • S. H. Shi and C. P. Wong, "Study of the fluxing agent effects on the properties of no-flow underfill materials for flip-chip applications," in Proc. 48th Electron. Comp. Technol. Conf. '98, 1998, p. 117.
    • (1998) Proc. 48th Electron. Comp. Technol. Conf. '98 , pp. 117
    • Shi, S.H.1    Wong, C.P.2
  • 10
    • 0032156984 scopus 로고    scopus 로고
    • High performance no-flow underfills for low-cost flip-chip applications: Material characterization
    • Sept.
    • C. P. Wong, S. H. Shi, and G. Jefferson, "High performance no-flow underfills for low-cost flip-chip applications: Material characterization," IEEE Trans. Comp., Packag., Manufact. Technol. A, vol. 21, pp. 450-458, Sept. 1998.
    • (1998) IEEE Trans. Comp., Packag., Manufact. Technol. A , vol.21 , pp. 450-458
    • Wong, C.P.1    Shi, S.H.2    Jefferson, G.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.