Suppression of radiated emission from an 8-bit micro-controller using gate-oxide filtering capacitors

IEEE International Symposium on Electromagnetic Compatibility

Volumn 2, Issue , 1999, Pages 811-815

  Kim, Hyungsoo ^a   Kim, Jooghoon ^a   Ryu, Woonghwan ^a   Sung, Myunghee ^a   Ahn, Seungyoung ^a   Kim, Joungho ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC COMPATIBILITY; ELECTROMAGNETIC SHIELDING; GATES (TRANSISTOR); INTEGRATED CIRCUITS; CAPACITORS; CMOS INTEGRATED CIRCUITS; ELECTRIC SURGES; INTEGRATED CIRCUIT MANUFACTURE; INTERFERENCE SUPPRESSION; MICROCONTROLLERS; OXIDES;

DESIGN PROCEDURE; GATE OXIDE; ON CHIPS; PACKAGE LEVELS; RADIATED EMISSIONS; SUPPRESSION TECHNIQUE; SURGE CURRENT; VOLTAGE FLUCTUATIONS;

MICROCONTROLLERS; ELECTROMAGNETIC WAVE EMISSION;

ON CHIP FILTERING CAPACITORS; RADIATED EMISSION;

EID: 0033354670     PISSN: 10774076     EISSN: 21581118     Source Type: Conference Proceeding    
DOI: 10.1109/ISEMC.1999.810124     Document Type: Conference Paper

References (4)

1. H.B. Bakoglu, "Circuits, Interconnections, and Packaging for VLSI", Addison-Wesley, 1990
2. Henry W. Ott, "Noise Reduction Techniques in Electronic Systems" 2nd Ed, John Wiley & Sons, 1988
3. Patrik Larsson, "Resonance and Damping in CMOS Circuits with On-Chip Decoupling Capacitance", IEEE Trans on circuits and systems-I, Vol. 45, No. 8, August 1998.
4. Daniel W. Dobberphul, et al., "A 200-MHz 64-b Dual-Issue CMOS Microprocessor", IEEE JSSC, Vol. 27, No. 11, November 1992