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Volumn 1, Issue 3, 1999, Pages 386-389

Microtopographic birefringence measurements of transparent thin plates using a Faraday modulator - application to stress measurements

Author keywords

[No Author keywords available]

Indexed keywords

BIREFRINGENCE; FARADAY EFFECT; LIGHT MODULATORS; POLARIMETERS; TRANSPARENCY;

EID: 0033352429     PISSN: 14644258     EISSN: None     Source Type: Journal    
DOI: 10.1088/1464-4258/1/3/308     Document Type: Article
Times cited : (9)

References (9)
  • 1
    • 0037604435 scopus 로고    scopus 로고
    • Derivation of retardation phase in computer-aided photoelasticity by using carrier fringe phase shifting
    • Ng T W 1997 Derivation of retardation phase in computer-aided photoelasticity by using carrier fringe phase shifting Appl. Opt. 36 8259-63
    • (1997) Appl. Opt. , vol.36 , pp. 8259-8263
    • Ng, T.W.1
  • 2
    • 0029209236 scopus 로고
    • Stress measurement of transparent materials by polarised laser
    • Niitsu Y, Ichinose K and Ikegami K 1995 Stress measurement of transparent materials by polarised laser JSME Int. J. A 38 68-72
    • (1995) JSME Int. J. A , vol.38 , pp. 68-72
    • Niitsu, Y.1    Ichinose, K.2    Ikegami, K.3
  • 3
    • 0040611181 scopus 로고    scopus 로고
    • Measurement of low-level strain birefringence in optical elements using a photoelastic modulator
    • Oakberg T C 1997 Measurement of low-level strain birefringence in optical elements using a photoelastic modulator SPIE 2873 17
    • (1997) SPIE , vol.2873 , pp. 17
    • Oakberg, T.C.1
  • 4
    • 0039425676 scopus 로고    scopus 로고
    • A new method of determining the stress state in microelectronic materials
    • Hancheng L, Shounan Z and Ken Chin K 1996 A new method of determining the stress state in microelectronic materials Meas. Sci. Technol. 7 102-5
    • (1996) Meas. Sci. Technol. , vol.7 , pp. 102-105
    • Hancheng, L.1    Shounan, Z.2    Ken Chin, K.3
  • 5
    • 36449002580 scopus 로고
    • Two-dimensional state of stress in silicon wafer
    • Hancheng L and Shounan Z 1992 Two-dimensional state of stress in silicon wafer J. Appl. Phys. 71 2863
    • (1992) J. Appl. Phys. , vol.71 , pp. 2863
    • Hancheng, L.1    Shounan, Z.2
  • 6
    • 43949163353 scopus 로고
    • A new and high precision achromatic ellipsometer: A two-channel and polarisation rotator method
    • Monin J, Sahsah H and Brevet-Philibert O 1993 A new and high precision achromatic ellipsometer: a two-channel and polarisation rotator method Thin Solid Film 234 408-11
    • (1993) Thin Solid Film , vol.234 , pp. 408-411
    • Monin, J.1    Sahsah, H.2    Brevet-Philibert, O.3
  • 7
    • 0342811651 scopus 로고
    • Thèse Université de Saint-Etienne
    • Sahsah H 1994 Thèse Université de Saint-Etienne
    • (1994)
    • Sahsah, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.