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Volumn 38, Issue 10, 1999, Pages 6058-6065
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Simultaneous calculation of reflection, physical sputtering and secondary electron emission from a metal surface due to impact of low-energy ions
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
LIGHT REFLECTION;
MONTE CARLO METHODS;
SECONDARY EMISSION;
SPUTTERING;
ELECTRON CASCADES;
ION REFLECTION;
PHYSICAL SPUTTERING;
ION BOMBARDMENT;
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EID: 0033350673
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.38.6058 Document Type: Article |
Times cited : (14)
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References (40)
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