Monte Carlo simulation of yield and energy distribution of secondary electrons emitted from metal surfaces

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 35, Issue 12 A, 1996, Pages 6226-6232

  Ohya, Kaoru ^a   Harada, Akio ^a   Kawata, Jun ^b   Nishimura, Kenji ^c  

^a UNIVERSITY OF TOKUSHIMA   (Japan)

^b NATIONAL INSTITUTE OF TECHNOLOGY   (Japan)

^c NUMAZU COLLEGE OF TECHNOLOGY   (Japan)

Author keywords

Elastic scattering; Electron energy distribution; Partial wave expansion; Screened Rutherford formula; Secondary electron emission; Secondary electron yield

Indexed keywords

ATOMIC NUMBER; ELECTRON ENERGY DISTRIBUTION; KOLLATH EMPIRICAL FORMULA; SCREENED RUTHERFORD FORMULA; SECONDARY ELECTRON EMISSION; SECONDARY ELECTRON YIELD;

ALUMINUM; BERYLLIUM; COMPUTER SIMULATION; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; MAGNESIUM; MATHEMATICAL MODELS; MOLYBDENUM; MONTE CARLO METHODS; SURFACE PHENOMENA; TUNGSTEN;

ELECTRON EMISSION;

EID: 0030402586     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.35.6226     Document Type: Article

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