Clamping effect on the microwave properties of ferroelectric thin films

Semiconductor Science and Technology

Volumn 14, Issue 11, 1999, Pages 961-966

  Poplavko, Y ^a   Cho, N I ^a  

^a SunMoon University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; DIELECTRIC LOSSES; FERROELECTRIC MATERIALS; FREQUENCIES; MICROWAVE DEVICES; POLARIZATION; SEMICONDUCTOR MATERIALS; SPECTROSCOPY; STRESSES; TEMPERATURE;

BULK FILM PROPERTIES; BULK MATERIALS; DIELECTRIC SPECTROSCOPY; ELECTRONIC DEVICES; FERROELECTRIC THIN FILMS; FREE STRESS VOLUME FERROELECTRIC; MICROWAVE PROPERTIES; PARAELECTRIC FILMS;

THIN FILMS;

EID: 0033350356     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/14/11/303     Document Type: Article

References (11)

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