Growth and fatigue properties of pulsed laser deposited Pb1-xLax(ZryTiz)O3 thin films with [00/] preferred orientation

Journal of Materials Science: Materials in Electronics

Volumn 7, Issue 6, 1996, Pages 409-417

  Lin, W J ^a,b   Tseng, T Y ^a   Wu, Y Z ^a   Lin, S P ^a   Tu, S L ^a   Chang, H ^a   Yang, S J ^a   Lin, I N ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; DEGRADATION; DEPOSITION; FATIGUE OF MATERIALS; FERROELECTRIC MATERIALS; FILM GROWTH; PIEZOELECTRICITY; POLARIZATION; PULSED LASER APPLICATIONS; SEMICONDUCTING LEAD COMPOUNDS; SWITCHING;

PIEZOELECTRICALLY INDUCED STRAIN; POLARIZATION SWITCHING CYCLES; POLARIZATION VECTOR;

SEMICONDUCTING FILMS;

EID: 0030394282     PISSN: 09574522     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF00180778     Document Type: Article

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