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Volumn 9, Issue 4, 1999, Pages 294-299

Design-based approach to planarization in multilayer surface micromachining

Author keywords

[No Author keywords available]

Indexed keywords

MICROELECTROMECHANICAL DEVICES; MULTILAYERS; SURFACE TOPOGRAPHY; THIN FILMS;

EID: 0033350191     PISSN: 09601317     EISSN: None     Source Type: Journal    
DOI: 10.1088/0960-1317/9/4/302     Document Type: Article
Times cited : (9)

References (17)
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    • Aspect-ratio-independent-coating (ARIC) SOG process for the double metal 16M DRAM planarization
    • Chen L 1995 Aspect-ratio-independent-coating (ARIC) SOG process for the double metal 16M DRAM planarization Proc. VLSI Interconnect Conf. p 274
    • (1995) Proc. VLSI Interconnect Conf. , pp. 274
    • Chen, L.1
  • 3
    • 0025956665 scopus 로고
    • Planarized inorganic interlevel dielectric for multilevel metallization
    • Nagy A and Hubert J 1991 Planarized inorganic interlevel dielectric for multilevel metallization Solid State Technol. 34 (1) 53
    • (1991) Solid State Technol. , vol.34 , Issue.1 , pp. 53
    • Nagy, A.1    Hubert, J.2
  • 4
    • 0026170357 scopus 로고
    • Application of chemical mechanical polishing to the fabrication of VLSI circuit interconnection
    • Patrick W, Guthrie W, Standley C and Schiable P 1991 Application of chemical mechanical polishing to the fabrication of VLSI circuit interconnection J. Electrochem. Soc. 138 1778-84
    • (1991) J. Electrochem. Soc. , vol.138 , pp. 1778-1784
    • Patrick, W.1    Guthrie, W.2    Standley, C.3    Schiable, P.4
  • 5
    • 0021640198 scopus 로고
    • Planar processed polysilicon sealed cavities for pressure transducer arrays
    • Guckel H and Burns D 1984 Planar processed polysilicon sealed cavities for pressure transducer arrays IEDM 223-5
    • (1984) IEDM , pp. 223-225
    • Guckel, H.1    Burns, D.2
  • 6
    • 0010402043 scopus 로고
    • Plasma planarization for sensor applications
    • Li Y, French P and Wolffenbuttel R 1995 Plasma planarization for sensor applications IEEE JMEMS 4 119-31
    • (1995) IEEE JMEMS , vol.4 , pp. 119-131
    • Li, Y.1    French, P.2    Wolffenbuttel, R.3
  • 10
    • 0000959648 scopus 로고    scopus 로고
    • Development of microelectromechanical deformable mirrors for phase modulation of light
    • Krishnamoorthy Mali R, Bifano T G, Vandelli N and Horenstein M N 1997 Development of microelectromechanical deformable mirrors for phase modulation of light Opt. Engng. 36 542-8
    • (1997) Opt. Engng. , vol.36 , pp. 542-548
    • Krishnamoorthy Mali, R.1    Bifano, T.G.2    Vandelli, N.3    Horenstein, M.N.4
  • 11
    • 0024755516 scopus 로고
    • Deposition profile simulation using the direct simulation Monte Carlo method
    • Ikegawa M and Kobayashi J 1989 Deposition profile simulation using the direct simulation Monte Carlo method J. Electrochem. Soc. 136 2982-6
    • (1989) J. Electrochem. Soc. , vol.136 , pp. 2982-2986
    • Ikegawa, M.1    Kobayashi, J.2
  • 12
    • 84957227118 scopus 로고
    • Monte Carlo simulation of thin film deposition in a rectangular groove
    • Cooke M J and Harris G 1989 Monte Carlo simulation of thin film deposition in a rectangular groove J. Vac. Sci. Technol. A 7 3217-21
    • (1989) J. Vac. Sci. Technol. A , vol.7 , pp. 3217-3221
    • Cooke, M.J.1    Harris, G.2
  • 13
    • 0005293584 scopus 로고
    • Simulation of the microstructure of chemical vapor deposited refractory thin films
    • Dew S K, Smy T and Brett M J 1992 Simulation of the microstructure of chemical vapor deposited refractory thin films J. Vac. Sci. Technol. B 10 618-24
    • (1992) J. Vac. Sci. Technol. B , vol.10 , pp. 618-624
    • Dew, S.K.1    Smy, T.2    Brett, M.J.3
  • 14
    • 0028498145 scopus 로고
    • Simulation of rarefied gas transport and profile evolution in nonplanar substrate chemical vapor deposition
    • Coronell D G and Jensen K F 1994 Simulation of rarefied gas transport and profile evolution in nonplanar substrate chemical vapor deposition J. Electrochem. Soc. 141 2545-51
    • (1994) J. Electrochem. Soc. , vol.141 , pp. 2545-2551
    • Coronell, D.G.1    Jensen, K.F.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.