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Surface Science

Volumn 442, Issue 3, 1999, Pages 349-356

Soft X-ray resonant magnetic scattering from thin Ni layers on Cu( 110)

(3) Sacchi, Maurizio a Mirone, Alessandro a Lacobucci, Stefano b

a UNIVERSITÉ PARIS SACLAY (France)

b IMAI del CNR (Italy)

Author keywords

Copper; Magnetic measurements; Nickel; X ray scattering, diffraction, and reflection

Indexed keywords

COPPER; MAGNETIC MOMENTS; X RAY DIFFRACTION; X RAY SCATTERING;

SOFT X RAY RESONANT MAGNETIC SCATTERING;

NICKEL;

EID: 0033344959 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(99)00850-X Document Type: Article

Times cited : (13)

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