-
1
-
-
0037726756
-
-
L.E. Antonuk, Y. El-Mohri, A. Hall, K.-W. Jee, M. Maolinbay, S. C. Nassif, X. Rong, J. H. Siewerdsen, Q. Zhao, and R. L. Weisfield, "A Large-Area, 97 -m Pitch, Indirect-Detection, Active Matrix, Flat-Panel Imager (AMFPI)", Proceedings of SPIE 3336 (1998) p. 2.
-
"A Large-Area, 97 -M Pitch, Indirect-Detection, Active Matrix, Flat-Panel Imager (AMFPI)", Proceedings of SPIE 3336 (1998) P. 2.
-
-
Antonuk, L.E.1
El-Mohri, Y.2
Hall, A.3
Jee, K.-W.4
Maolinbay, M.5
Nassif, S.C.6
Rong, X.7
Siewerdsen, J.H.8
Zhao, Q.9
Weisfield, R.L.10
-
2
-
-
0032401676
-
-
Proc. SPIE Conf. On Physics of Medical Imaging, 3336, San Diego, CA, Feb. 1998, p. 444.
-
R.L. Weisfield, MA. Hartney, R.A. Street, R.B. Apte, "New Amorphous-Silicon Image Sensor for X-ray Diagnostic Medical Imaging Applications," Proc. SPIE Conf. On Physics of Medical Imaging, 3336, San Diego, CA, Feb. 1998, p. 444.
-
"New Amorphous-Silicon Image Sensor for X-ray Diagnostic Medical Imaging Applications,"
-
-
Weisfield, R.L.1
Hartney, M.A.2
Street, R.A.3
Apte, R.B.4
-
3
-
-
0032402697
-
-
Proc. SPIE Conf. On Physics of Medical Imaging, 3336, San Diego, CA, Feb. 1998, p. 35.
-
T.J.C Bruijns, P.L. Alving, E.L. Baker, R.F. Bury, A.R. Cowen, N. Jung, H.A. Luijendijk, HJ. Meulenbrugge, H.J. Stouten, "Technical and Clinical Results of an Experimental Flat Dynamic (Digital) X-ray Image Detector (FDXD) System with Real_time Corrections," Proc. SPIE Conf. On Physics of Medical Imaging, 3336, San Diego, CA, Feb. 1998, p. 35.
-
"Technical and Clinical Results of An Experimental Flat Dynamic (Digital) X-ray Image Detector (FDXD) System with Real_time Corrections,"
-
-
Bruijns, T.J.C.1
Alving, P.L.2
Baker, E.L.3
Bury, R.F.4
Cowen, A.R.5
Jung, N.6
Luijendijk, H.A.7
Meulenbrugge, H.J.8
Stouten, H.J.9
-
4
-
-
0032401637
-
-
X-ray Flat Panel Detector Provides Superior Detectivity and Immediate Direct Digital Output for General Radiography Systems," Proc. SPIE Conf. On Physics of Medical imaging, 3336, San Diego, CA, Feb. 1998, p. 45.
-
[4J C. Chaussât, J. Chabbal, T. Ducourant, V. Spinnlcr, G. Vieux, R. Neyret, "New CsI/a-Si 17"xl7" X-ray Flat Panel Detector Provides Superior Detectivity and Immediate Direct Digital Output for General Radiography Systems," Proc. SPIE Conf. On Physics of Medical imaging, 3336, San Diego, CA, Feb. 1998, p. 45.
-
"New CsI/a-Si 17"xl7"
-
-
Chaussât, J.C.1
Chabbal, J.2
Ducourant, T.3
Spinnlcr, V.4
Vieux, G.5
Neyret, R.6
-
6
-
-
0029548131
-
-
Mat. Res. Soc. Symp. Proc. 377, (1995) pp. 757-765.
-
R.A. Street, X.D. Wu, R. Weisfield, S. Ready, R. Apte, M. Nguyen, and P. Nylen, "Two dimensional Amorphous Silicon Image Sensor Arrays," Mat. Res. Soc. Symp. Proc. 377, (1995) pp. 757-765.
-
"Two Dimensional Amorphous Silicon Image Sensor Arrays,"
-
-
Street, R.A.1
Wu, X.D.2
Weisfield, R.3
Ready, S.4
Apte, R.5
Nguyen, M.6
Nylen, P.7
-
7
-
-
0031352167
-
-
Mat. Res. Soc. Symp. Proc. 467 (1997) p. 863.
-
M.J. Powell, C. Classe, I.D. French, A.R. Franklin, J.R. Hughes, and J.E. Curran, "Amorphous Silicon Photodiode-Thin Film Transistor Image Sensor with Diode on Top Structure," Mat. Res. Soc. Symp. Proc. 467 (1997) p. 863.
-
"Amorphous Silicon Photodiode-Thin Film Transistor Image Sensor with Diode on Top Structure,"
-
-
Powell, M.J.1
Classe, C.2
French, I.D.3
Franklin, A.R.4
Hughes, J.R.5
Curran, J.E.6
-
8
-
-
33747436649
-
-
CompuScope 512 Data Acquisition Card, is manufactured by GaGe Applied Sciences Inc., 5610 Bois Franc, Montreal, QC, CANADA.
-
CompuScope 512 Data Acquisition Card, Is Manufactured by GaGe Applied Sciences Inc., 5610 Bois Franc, Montreal, QC, CANADA.
-
-
-
9
-
-
0032224758
-
-
Proc. SPIE 3301, pp. 2-8, 1998.
-
R.B. Apte, R.A. Street, S.E. Ready, D.A. Jared, A.M. Moore, R.L. Weisfield, T.A. Rodericks, T.A. Granberg, "Large-Area, Low-Noise Amorphous Silicon Imaging System," Proc. SPIE 3301, pp. 2-8, 1998.
-
"Large-Area, Low-Noise Amorphous Silicon Imaging System,"
-
-
Apte, R.B.1
Street, R.A.2
Ready, S.E.3
Jared, D.A.4
Moore, A.M.5
Weisfield, R.L.6
Rodericks, T.A.7
Granberg, T.A.8
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