X-ray photoelectron spectroscopy characterization of submicrometer-sized polypyrrole-polystyrene composites

Langmuir

Volumn 15, Issue 23, 1999, Pages 8059-8066

  Cairns, D B ^a   Armes, S P ^a   Chehimi, M M ^b   Perruchot, C ^b   Delamar, M ^b  

^a UNIVERSITY OF SUSSEX   (United Kingdom)

^b UNIVERSITÉ PARIS DESCARTES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; LATEXES; MORPHOLOGY; PARTICLE SIZE ANALYSIS; POLYETHYLENE GLYCOLS; POLYPYRROLES; POLYSTYRENES; SCANNING ELECTRON MICROSCOPY; STABILIZERS (AGENTS); SURFACE STRUCTURE; X RAY PHOTOELECTRON SPECTROSCOPY;

CORE SHELL MORPHOLOGY; PYRROLE MONOMER; SURFACE CONCENTRATION; SURFACE DOPING; TOTAL LATEX SURFACE AREA;

COMPOSITE MATERIALS;

EID: 0033341208     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la990443k     Document Type: Article

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