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Volumn 273-274, Issue , 1999, Pages 553-556

Effects of nitrogen on dislocations in silicon during heat treatment

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; ANNEALING; CRYSTAL GROWTH FROM MELT; DISLOCATIONS (CRYSTALS); NITROGEN; SEMICONDUCTOR GROWTH; STRESS RELAXATION;

EID: 0033340852     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)00571-2     Document Type: Article
Times cited : (46)

References (15)
  • 15
    • 0019716503 scopus 로고
    • H.R. Huff, et al., (Eds.), Electrochem Soc, Pennington, NJ
    • K. Sumino, in: H.R. Huff, et al., (Eds.), Semiconductor Silicon 1981: Part II, Electrochem Soc, Pennington, NJ, 1981, pp. 208-219.
    • (1981) Semiconductor Silicon 1981: Part II , pp. 208-219
    • Sumino, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.