Optical properties and structural characterization of erbium-activated SiO2-TiO2 planar waveguides prepared by rf sputtering

Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties

Volumn 79, Issue 11-12, 1999, Pages 2103-2112

  Tosello, C ^a   Ronchin, S ^a   Moser, E ^a   Montagna, M ^a   Mazzoldi, P ^b   Gonella, F ^b   Ferrari, M ^c   Duverger, C ^a   Belli, R ^a   Battaglin, G ^d  

^a UNIVERSITY OF TRENTO   (Italy)

^b UNIVERSITY OF PADOVA   (Italy)

^c Centro Fisica Degli Stati Aggregati   (Italy)

^d CA' FOSCARI UNIVERSITY OF VENICE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DOPING (ADDITIVES); ERBIUM; OPTICAL WAVEGUIDES; PHOTOLUMINESCENCE; RAMAN SPECTROSCOPY; REFRACTIVE INDEX; SILICA; SPUTTERING; SUBSTRATES; TITANIUM DIOXIDE;

PLANAR WAVEGUIDES; RADIO FREQUENCY SPUTTERING; WAVEGUIDE LUMINESCENCE SPECTROSCOPY;

OPTICAL FILMS;

EID: 0033340690     PISSN: 13642812     EISSN: None     Source Type: Journal    
DOI: 10.1080/13642819908223099     Document Type: Article

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