Nanoscopic imaging of mechanical properties of metal films with magnetic-force-controlled AFM

Surface Science

Volumn 433, Issue , 1999, Pages 567-574

  Yamamoto, S I ^a,d   Yamada, H ^a   Matsushige, K ^a   Ishida, T ^b   Mizutani, W ^c,e   Tokumoto, H ^c,e  

^a KYOTO UNIVERSITY   (Japan)

^b JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

^c NATL INST FOR ADV INTERDISC RES   (Japan)

^d PANASONIC CORPORATION   (Japan)

^e ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELASTIC MODULI; ELASTICITY; GOLD; NANOSTRUCTURED MATERIALS; SCANNING TUNNELING MICROSCOPY; SILVER;

CONVENTIONAL FORCE MODULATION; INORGANIC FILMS; MAGNETIC FORCE CONTROLLED ATOMIC FORCE MICROSCOPY;

METALLIC FILMS;

EID: 0033339113     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00034-5     Document Type: Article

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