Compositional mapping of metal films by friction force microscopy and force modulation methods

Materials Research Society Symposium - Proceedings

Volumn 522, Issue , 1998, Pages 475-480

  Yamamoto, Shin ichi ^a   Yamada, Hirofumi ^a   Matsushige, Kazumi ^a  

^a PANASONIC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

FORCE MEASUREMENT; FRICTION; GOLD; GRAIN SIZE AND SHAPE; MICROSCOPIC EXAMINATION; NICKEL; STIFFNESS; SURFACE TOPOGRAPHY;

FORCE MODULATION METHOD (FMM); FRICTION FORCE MICROSCOPY (FFM);

METALLIC FILMS;

EID: 0032313848     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)