The "current driven model"-experimental verification and the contribution of Idd delta to digital device radiation

IEEE International Symposium on Electromagnetic Compatibility

Volumn 1, Issue , 1999, Pages 317-322

  Dash, Glen ^a   Curtis, Jon ^b   Straus, Isidor ^b  

^a Ampyx   (United States)

^b Curtis Stmu LLC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; DIGITAL DEVICES; ELECTRIC INDUCTORS; ELECTRIC RESISTANCE; LOGIC GATES; PRINTED CIRCUIT BOARDS;

CURRENT DRIVEN MODEL; DIGITAL DEVICE RADIATION;

SEMICONDUCTOR DEVICE MODELS;

EID: 0033337636     PISSN: 10774076     EISSN: 21581118     Source Type: Conference Proceeding    
DOI: 10.1109/ISEMC.1999.812920     Document Type: Conference Paper

References (5)

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3. R. Hill, T. Van Doren, T. Hubing, J. Drewniak, and F. Gisin, "Common Mode Currents Induced On Wires Attached To Multilayered Printed Wire Boards With Segmented Ground Planes," 1994 IEEE International Symposium on Electromagnetic Compatibility, Page 116.
4. F. J. Tilley, "Reducing Radiated Emissions on High Speed Signal Lines Using Common Mode Choke Coils," IEEE Symposium on Electromagnetic Compatibility, 1995.
5. C. R. Paul, Introduction to Electromagnetic Compatibility, John Wiley and Sons, 1992, Page 271.