Quantifying EMI resulting from finite-impedance reference planes

IEEE Transactions on Electromagnetic Compatibility

Volumn 39, Issue 4, 1997, Pages 286-297

  Hockanson, David M ^a,b   Drewniak, James L ^a,b   Hubing, Todd H ^a,b   Van Doren, Thomas P ^a,b   Sha, Fei ^a,c   Lam, Cheung Wei ^d   Rubin, Lawrence ^d  

^a IEEE   (United States)

^b University of Missouri Rolla   (United States)

^c BEIJING JIAOTONG UNIVERSITY   (China)

^d Viewlogic Systems Inc   (United States)

Author keywords

Electromagnetic coupling; Electromagnetic interference; Inductance

Indexed keywords

ELECTRIC IMPEDANCE; ELECTRIC NETWORK PARAMETERS; ELECTROMAGNETIC COMPATIBILITY; EQUIVALENT CIRCUITS; MATHEMATICAL MODELS; PRINTED CIRCUIT BOARDS;

ELECTROMAGNETIC COUPLING; PARASITIC INDUCTANCE;

ELECTROMAGNETIC WAVE INTERFERENCE;

EID: 0031269970     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/15.649814     Document Type: Article

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