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Thin Solid Films

Volumn 353, Issue 1, 1999, Pages 254-258

Effect of annealing rate on the crystallization process in Ge5Bi18Se77 films

(2) Rajagopalan, T a Reddy, G B a

a INDIAN INSTITUTE OF TECHNOLOGY DELHI (India)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL STRUCTURE; CRYSTALLIZATION; DEPOSITION; ENERGY DISPERSIVE SPECTROSCOPY; EVAPORATION; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING GERMANIUM COMPOUNDS; SURFACE STRUCTURE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

FACE CENTRED CUBIC PHASE; POLYCRYSTALLINE FILM; SINGLE CRYSTAL FILM; THERMAL EVAPORATION;

THIN FILMS;

EID: 0033336238 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(99)00361-2 Document Type: Article

Times cited : (16)

References (15)

1
- 0027107117
- Nishi J., Morimoto S., Ingawa I., Iizuka R., Yamashita T., Yamagishi T. J. Non-Cryst. Solids. 140:1992;199.
- (1992) J. Non-Cryst. Solids , vol.140 , pp. 199
- Nishi, J.¹ Morimoto, S.² Ingawa, I.³ Iizuka, R.⁴ Yamashita, T.⁵ Yamagishi, T.⁶

2
- 0022177671
- Bristol: Adam Hilger
- Savage J.A. Infrared Optical Materials and their Anti-reflection Coatings. 1985;Adam Hilger, Bristol.
- (1985) Infrared Optical Materials and Their Anti-reflection Coatings
- Savage, J.A.¹

3
- 0023288224
- Nasu H., Mackenzie J.D. Opt. Eng. 26:1987;102.
- (1987) Opt. Eng. , vol.26 , pp. 102
- Nasu, H.¹ Mackenzie, J.D.²

4
- 0000231634
- Leung W., Cheung N.W., Neureuther A.R. Appl. Phys. Lett. 46:1985;481.
- (1985) Appl. Phys. Lett. , vol.46 , pp. 481
- Leung, W.¹ Cheung, N.W.² Neureuther, A.R.³

5
- 36849098287
- Feinleib J., DeNeufville J., Moss S.C., Ovshinsky S.R. Appl. Phys. Lett. 18:1971;254.
- (1971) Appl. Phys. Lett. , vol.18 , pp. 254
- Feinleib, J.¹ DeNeufville, J.² Moss, S.C.³ Ovshinsky, S.R.⁴

6
- 0015975356
- DeNeufville J.P., Moss S.C., Ovshinsky S.R. J. Non-Cryst. Solids. 13:1973;191.
- (1973) J. Non-Cryst. Solids , vol.13 , pp. 191
- DeNeufville, J.P.¹ Moss, S.C.² Ovshinsky, S.R.³

7
- 0018307442
- Singh B., Rajagopalan S., Bhat P.K., Pandya D.K., Chopra K.L. Solid State Commun. 29:1979;167.
- (1979) Solid State Commun. , vol.29 , pp. 167
- Singh, B.¹ Rajagopalan, S.² Bhat, P.K.³ Pandya, D.K.⁴ Chopra, K.L.⁵

8
- 0019626299
- Chopra K.L., Harshvardhan S., Rajagopalan S., Malhotra L.K. Solid State Commun. 40:1981;387.
- (1981) Solid State Commun. , vol.40 , pp. 387
- Chopra, K.L.¹ Harshvardhan, S.² Rajagopalan, S.³ Malhotra, L.K.⁴

9
- 0000034329
- Afonso C.N., Solis J., Catalina F., Kalpouzos C. Appl. Phys. Lett. 60:1992;3123.
- (1992) Appl. Phys. Lett. , vol.60 , pp. 3123
- Afonso, C.N.¹ Solis, J.² Catalina, F.³ Kalpouzos, C.⁴

10
- 36549094036
- Chen M., Rubin K.A., Marrello V., Gerber U.G., Jipson V.B. Appl. Phys. Lett. 46:1985;734.
- (1985) Appl. Phys. Lett. , vol.46 , pp. 734
- Chen, M.¹ Rubin, K.A.² Marrello, V.³ Gerber, U.G.⁴ Jipson, V.B.⁵

11
- 0026945304
- Reddy G.B., Dhar A., Malhotra L.K., Sharmila E.K. Thin Solid Films. 220:1992;111.
- (1992) Thin Solid Films , vol.220 , pp. 111
- Reddy, G.B.¹ Dhar, A.² Malhotra, L.K.³ Sharmila, E.K.⁴

12
- 0343214628
- Sripathi Y., Reddy G.B., Malhotra L.K. J. Mater. Sci. Mater. Electron. 2:1991;109.
- (1991) J. Mater. Sci. Mater. Electron. , vol.2 , pp. 109
- Sripathi, Y.¹ Reddy, G.B.² Malhotra, L.K.³

13
- 0342631245
- Strand D., Gonalez-Hernandez J., Chao B.S., Ovshinsky S.R., Gasiorowski P., Pawlik D.A. Mater. Res. Soc. Symp. Proc. 230:1992;251.
- (1992) Mater. Res. Soc. Symp. Proc. , vol.230 , pp. 251
- Strand, D.¹ Gonalez-Hernandez, J.² Chao, B.S.³ Ovshinsky, S.R.⁴ Gasiorowski, P.⁵ Pawlik, D.A.⁶

14
- 0032050532
- Rajagopalan T., Reddy G.B. J. Mater. Sci. Mater. Electron. 9:(2):1998;133.
- (1998) J. Mater. Sci. Mater. Electron. , vol.9 , Issue.2 , pp. 133
- Rajagopalan, T.¹ Reddy, G.B.²

15
- 0025416952
- Munoz A., Cumbrera F.L., Marquez R. Thin Solid Films. 186:1990;37.
- (1990) Thin Solid Films , vol.186 , pp. 37
- Munoz, A.¹ Cumbrera, F.L.² Marquez, R.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.