Longitudinal light profile microscopy: A new method for seeing below the surfaces of thin-film materials

Applied Spectroscopy

Volumn 53, Issue 12, 1999, Pages 1507-1519

  Power, J F ^a   Fu, S W ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFACES (MATERIALS); LASER BEAMS; LASER RECORDING; LIGHT ABSORPTION; LIGHT SCATTERING; LIGHT TRANSMISSION; LUMINESCENCE OF SOLIDS; THIN FILMS;

DEPTH PROFILING; LONGITUDINAL LIGHT PROFILE MICROSCOPY (LLPM);

OPTICAL MICROSCOPY;

EID: 0033335999     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702991946244     Document Type: Article

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