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Volumn 15, Issue 23, 1999, Pages 7897-7900
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New tool for studying the in situ growth processes for self-assembled monolayers under ambient conditions
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Author keywords
[No Author keywords available]
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Indexed keywords
ADSORPTION;
ATOMIC FORCE MICROSCOPY;
CRYSTAL LATTICES;
FILM GROWTH;
MOLECULAR DYNAMICS;
NUCLEATION;
ORGANIC SOLVENTS;
PROBES;
X RAY DIFFRACTION ANALYSIS;
IN-SITU GROWTH PROCESSES;
ISLAND FORMATION;
SCANNING PROBE MICROSCOPY;
SELF ASSEMBLED MONOLAYERS;
MONOLAYERS;
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EID: 0033335203
PISSN: 07437463
EISSN: None
Source Type: Journal
DOI: 10.1021/la991095p Document Type: Article |
Times cited : (62)
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References (17)
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