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Volumn 442, Issue 3, 1999, Pages 507-516
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Scanning tunneling microscopy, high-resolution electron energy loss spectroscopy, and theoretical studies of trimethylphosphine (TMP) on a Si( 111 )-(7 × 7) surface
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Author keywords
Chemisorption; Electron energy loss spectroscopy; Low index single crystal surfaces; Scanning tunneling microscopy; Semi empirical models model calculations; Semiconducting surfaces; Silicon; Trimethylphosphine
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Indexed keywords
ADSORPTION;
DISSOCIATION;
ELECTRON ENERGY LOSS SPECTROSCOPY;
HYDROGEN;
MATHEMATICAL MODELS;
PHOSPHORUS;
SCANNING TUNNELING MICROSCOPY;
SINGLE CRYSTALS;
HIGH RESOLUTION ELECTRON ENERGY LOSS SPECTROSCOPY (HREELS);
SEMI-EMPIRICAL MODELS;
TRIMETHYLPHOSPHINE;
SILICON;
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EID: 0033330422
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(99)00982-6 Document Type: Article |
Times cited : (5)
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References (34)
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