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Volumn 206, Issue 4, 1999, Pages 294-298
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Growth and investigation of SiGe films on buried Ge islands
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
GERMANIUM;
RELAXATION PROCESSES;
SEMICONDUCTING FILMS;
SEMICONDUCTING SILICON COMPOUNDS;
SUBSTRATES;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY CRYSTALLOGRAPHY;
BUFFERS;
ULTRAHIGH VACUUM CHEMICAL VAPOR DEPOSITION;
CRYSTAL GROWTH;
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EID: 0033328508
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(99)00338-3 Document Type: Article |
Times cited : (4)
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References (15)
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