The impact of software and CAE tools on SEU in field programmable gate arrays

IEEE Transactions on Nuclear Science

Volumn 46, Issue 6 PART 1, 1999, Pages 1461-1468

  Katz, R ^a   Wang, J ^a   McCollum, J ^a   Cronquist, B ^a  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMMERCIAL OF THE SHELF TOOLS; SINGLE EVENT UPSET; SPACECRAFT ELECTRONICS;

CAPACITORS; COMPUTER AIDED ENGINEERING; COMPUTER AIDED SOFTWARE ENGINEERING; FIELD PROGRAMMABLE GATE ARRAYS; FLIP FLOP CIRCUITS; RESISTORS; SPACECRAFT EQUIPMENT;

RADIATION EFFECTS;

EID: 0033324557     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.819108     Document Type: Article

References (1)

1. R.B. Katz, R. Barto, P. McKerracher, B. Carkhuff, and R. Koga, "SEU Hardening of FPGAs for Space Applications and Device Characterization," IEEE Transactions on Nuclear Science, NS-41.