Transient lattice vibration induced by coherent carrier captures at a deep-level defect and the effect on defect reactions

Physica B: Condensed Matter

Volumn 273-274, Issue , 1999, Pages 999-1002

  Shinozuka, Yuzo ^a,b   Karatsu, Tetsuya ^a  

^a YAMAGUCHI UNIVERSITY   (Japan)

^b WAKAYAMA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CHARGE CARRIERS; CRYSTAL DEFECTS;

COHERENT CAPTURE; DEFECT REACTION; MULTIPHONON RECOMBINATION;

LATTICE VIBRATIONS;

EID: 0033324014     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)00616-X     Document Type: Article

References (8)

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4. H. Sumi, J. Phys. C 17 (1984) 6071.
5. O. Ueda, Reliability and Degradation of III-V Optical Devices, Artech House Publishers, Boston-London, 1996.
6. Y. Shinozuka, T. Karatsu, Mater. Sci. Forum 258-263 (1997) 659.
7. Y. Shinozuka, in: J. Michel, T. Kennedy, K. Wada, K. Thonke (Eds.), Defects in Electronic Materials II, Proceedings of the MRS 1996 Fall Meeting, Vol. 442, p. 225.
8. Y. Shinozuka, in: K. Wada, S.W. Pang (Eds.), Defect in Optoelectronic Materials, Gordon and Bleach Publisher, London, 1999, Chapter 2.1.