In situ microanalysis for trace element and isotopic data by AMS

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 158, Issue 1, 1999, Pages 201-208

  Sie, S H ^a   Sims, D A ^a   Niklaus, T R ^a   Bruhn, F ^a   Suter, G ^a   Cripps, G ^a  

^a CSIRO   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

CESIUM; GEOCHEMISTRY; GEOCHRONOLOGY; ION SOURCES; MASS SPECTROMETRY; MICROANALYSIS; MINERAL EXPLORATION; PARTICLE ACCELERATORS; RADIOISOTOPES; TRACE ANALYSIS; TRACE ELEMENTS;

ACCELERATOR MASS SPECTROMETRY (AMS);

ION BEAMS;

EID: 0033322410     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)00353-5     Document Type: Article

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