A microbeam Cs ion source for accelerator mass spectrometry

Review of Scientific Instruments

Volumn 69, Issue 3, 1998, Pages 1353-1358

  Sie, S H ^a   Niklaus, T R ^a   Suter, G F ^a   Bruhn, F ^a  

^a CSIRO   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

CESIUM; GEOCHRONOLOGY; ION BEAMS; ION SOURCES; MINERALS; ROCKS; SPUTTERING;

ACCELERATOR MASS SPECTROMETRY; NEGATIVE ION SPUTTER SOURCE; SECONDARY ION EXTRACTION SYSTEM;

SECONDARY ION MASS SPECTROMETRY;

EID: 0032022504     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148806     Document Type: Article

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