Surface Observation of a Potassium-Doped C60 Thin Film by Scanning Tunneling Microscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 38, Issue 9 A, 1999, Pages 5239-5243

  Hosoi, Hirotaka ^a   Nagashima, Satoru ^a   Hatta, Eiji ^a   Sueoka, Kazuhisa ^a   Mukasa, Köichi ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

Author keywords

Fullerene; Potassium; Scanning tunneling microscope; Scanning tunneling spectroscopy; X ray diffraction

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; CURRENT VOLTAGE CHARACTERISTICS; DEPOSITION; DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY OF SOLIDS; ENERGY GAP; LATTICE CONSTANTS; POTASSIUM; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE; THIN FILMS; VAPORS;

BODY-CENTERED TETRAGONAL (BCT) LATTICE; FACE-CENTERED CUBIC (FCC) LATTICE;

FULLERENES;

EID: 0033322119     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.5239     Document Type: Article

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