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Surface Science

Volumn 385, Issue 2-3, 1997, Pages

Molecularly resolved observation of surface reconstruction of C60 epitaxial films by atomic force microscopy

(5) Kim, Y a Jiang, L b Iyoda, T b Hashimoto, K a,b Fujishima, A a,b

a UNIVERSITY OF TOKYO (Japan)

b TOKYO POLYTECHNIC UNIVERSITY (Japan)

Author keywords

Atomic force microscopy; C60; Fullerene films; Surface reconstruction

Indexed keywords

ATOMIC FORCE MICROSCOPY; EPITAXIAL GROWTH; MOLECULAR STRUCTURE; STACKING FAULTS; SURFACE PROPERTIES; SURFACE TREATMENT;

FACE CENTERED CUBIC STRUCTURES; MOLECULAR RESOLUTION IMAGES; SURFACE RECONSTRUCTION;

FULLERENES;

EID: 0031197408 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(97)00344-0 Document Type: Article

Times cited : (11)

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