Cross-correlation noise measurements in A/D converters

IEEE Transactions on Instrumentation and Measurement

Volumn 48, Issue 6, 1999, Pages 1282-1286

  Chiorboli, Giovanni ^a  

^a UNIVERSITY OF PARMA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; NONLINEAR SYSTEMS; PROBABILITY; SIGNAL NOISE MEASUREMENT; STATISTICAL METHODS; TIME VARYING SYSTEMS;

APERTURE UNCERTAINTY; CROSS CORRELATION NOISE; DUAL CHANNEL TECHNIQUE; JITTER MEASUREMENT; TIMING JITTER;

ANALOG TO DIGITAL CONVERSION;

EID: 0033312238     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.816149     Document Type: Article

References (8)

1. B. Travis, "Demystifying ADC's," EDN, p. 26, Mär. 1997.
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4. M. Shinagawa, Y. Akazawa, and T. Wakimoto, "Jitter analysis of highspeed sampling systems," IEEE J. Solid-State Circuits, vol. 25, pp. 220-224, Feb. 1990.
5. G. Chiorboli and C. Morandi, "Jitter analysis of A/D converters," in Proc. 2nd Int. Work. ADC Modeling and Testing. Tampere, Finland, June 1997, pp. 230-238.
6. Y.C. Jenq, "Digital spectra of nonuniformly sampled signals: theories and applications-Measuring clock aperture jitter of an A/D system," IEEE Trans. Instrum. Meas.. vol. 39, pp. 969-971, Dec. 1990.
7. Y. Langard, J. Balat, and J. Durand, "An improved method of ADC jitter measurement," in Proc. IEEE Int. Test Conf., 1994, pp. 763-770.
8. G. Chiorboli, M. Fontanili, and C. Morandi, "A new method for estimating aperture uncertainty of A/D converters," in IEEE Instrum. Meas. Tech. Conf.. Ottawa, Ont., Canada, May 1997, pp. 632-635.