A grazing-incidence reflectometer for BL-39XU at SPring-8

Journal of Synchrotron Radiation

Volumn 5, Issue 3, 1998, Pages 554-556

  Sakurai, Kenji ^a   Uehara, Shouji ^b   Goto, Shunji ^c  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b Kohzu Seiki Co Ltd   (Japan)

^c JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

Author keywords

Diffuse scattering; Grazing incidence; Instrumentation; Interface study; Non specular reflection; Specular reflection; Surface topography; Total reflection; TXRF; Ultra trace level analysis; X ray fluorescence

Indexed keywords

EID: 0032364272     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049597016658     Document Type: Article

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