Single-event effects in resolver-to-digital converters

IEEE Transactions on Nuclear Science

Volumn 46, Issue 6 PART 1, 1999, Pages 1445-1452

  Buchner, S ^a   Tran, L ^a   Mann, J ^a   Turflinger, T ^a   McMorrow, D ^a   Campbell, A ^a   Dozier, C ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

RESOLVER TO DIGITAL CONVERTERS; SINGLE EVENT EFFECTS; SINGLE EVENT LATCHUP; SINGLE EVENT UPSET;

ANALOG TO DIGITAL CONVERSION; COMPUTER SOFTWARE; FLIP FLOP CIRCUITS; HEAVY IONS; INTEGRATED CIRCUIT TESTING; PULSED LASER APPLICATIONS;

LASER BEAM EFFECTS;

EID: 0033311545     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.819106     Document Type: Article

References (5)

1. Synchro/Resolver Conversion Handbook, ILC Data Device Corporation,(1994).
2. Thomas L. Turflinger and Martin V. Davey, "Understanding Single Event Phenomena in Complex Analog and Digital Integrated Circuits," IEEE Trans. Nucl.
3. S. Buchner, D. McMorrow, J. Melinger and A.B. Campbell, "Laboratory Tests for Single-Event Effects," IEEE Trans. Nucl. Sei. NS-43, 678(1996).
4. S. Moss (Private Communication).
5. D. McMorrow, J. S. Melinger, S. Buchner, T. Scott, "Application of pulsed laser for evaluation and optimization of SEU-hard designs," submitted to RADECS99.