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Volumn 22, Issue 4, 1999, Pages 534-540

Properties of molding compounds to improve package reliability of SMD's

Author keywords

[No Author keywords available]

Indexed keywords

ATMOSPHERIC HUMIDITY; CRACK INITIATION; CROSSLINKING; EPOXY RESINS; GLASS TRANSITION; HEAT RESISTANCE; PLASTICS MOLDING; RELIABILITY; SOLDERING; SURFACE MOUNT TECHNOLOGY;

EID: 0033311124     PISSN: 15213331     EISSN: None     Source Type: Journal    
DOI: 10.1109/6144.814969     Document Type: Article
Times cited : (6)

References (10)
  • 4
    • 0030172393 scopus 로고    scopus 로고
    • A fracture mechanics analysis of the effects of material properties and geometries of components on various types of package cracks
    • H. Lee and Y. Y. Earmme A fracture mechanics analysis of the effects of material properties and geometries of components on various types of package cracks IEEE Comp. Packag. Manufact. Technol. A vol. 19. pp. 168-178 Jun. 1996.
    • IEEE Comp. Packag. Manufact. Technol. A Vol. 19. Pp. 168-178 Jun. 1996.
    • Lee, H.1    Earmme, Y.Y.2
  • 5
    • 33749939125 scopus 로고    scopus 로고
    • Molding compounds for ultra thin package of semiconductor devices Tech. Rep. Hitachi Chemical pp. 23-28 1992.
    • H. Suzuki H. Sashima T. Kawata and S. Ichimura Molding compounds for ultra thin package of semiconductor devices Tech. Rep. Hitachi Chemical pp. 23-28 1992.
    • Suzuki, H.1    Sashima, H.2    Kawata, T.3    Ichimura, S.4
  • 6
  • 8
    • 0021316842 scopus 로고    scopus 로고
    • Epoxy degradation induced Au-Al intermetallic void formation in plastic encapsulated MOS memories in
    • R. J. Gale Epoxy degradation induced Au-Al intermetallic void formation in plastic encapsulated MOS memories in Proc. 22nd Int. Reliab. Phys. Symp. 1984 pp. 37-47.
    • Proc. 22nd Int. Reliab. Phys. Symp. 1984 Pp. 37-47.
    • Gale, R.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.