Growth and characterization of defective diamond films

Thin Solid Films

Volumn 353, Issue 1, 1999, Pages 45-51

  Lee, Soonil ^a   Han, Seok Yoon ^a   Oh, Soo Ghee ^a  

^a Ajou University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; ELLIPSOMETRY; FILM GROWTH; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; NANOSTRUCTURED MATERIALS; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SURFACE ROUGHNESS; X RAY DIFFRACTION ANALYSIS;

BRUGGEMAN EFFECTIVE MEDIUM APPROXIMATION; DEFECTIVE DIAMOND FILM; DEPTH PROFILING; FILM THICKNESS;

DIAMOND FILMS;

EID: 0033309793     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00367-3     Document Type: Article

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