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Volumn 565, Issue , 1999, Pages 211-216
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Preparation and characterization of high porosity SiO2 xerogels for low k dielectrics
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Author keywords
[No Author keywords available]
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Indexed keywords
ADSORPTION;
CALCINATION;
CHARACTERIZATION;
DIELECTRIC MATERIALS;
HIGH TEMPERATURE OPERATIONS;
NITROGEN;
ORGANIC POLYMERS;
PERMITTIVITY;
PERMITTIVITY MEASUREMENT;
POROUS MATERIALS;
SOL-GELS;
X RAY DIFFRACTION ANALYSIS;
INTERMETAL DIELECTRIC FILM;
NITROGEN ADSORPTION MEASUREMENT;
XEROGELS;
SILICA GEL;
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EID: 0033300358
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (4)
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References (14)
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