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Volumn 565, Issue , 1999, Pages 211-216

Preparation and characterization of high porosity SiO2 xerogels for low k dielectrics

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; CALCINATION; CHARACTERIZATION; DIELECTRIC MATERIALS; HIGH TEMPERATURE OPERATIONS; NITROGEN; ORGANIC POLYMERS; PERMITTIVITY; PERMITTIVITY MEASUREMENT; POROUS MATERIALS; SOL-GELS; X RAY DIFFRACTION ANALYSIS;

EID: 0033300358     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article
Times cited : (4)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.